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| ![]() TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X, 2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLR 1
D1
CLK 1
PRE 1
Q1
GND
Q2
PRE 2 CLK 2
D2
CLR 2
Q1
Q2
VCC
Fig. 5
86
5.0 V
E
IN (D)
5.0 V
OUT
GND
5.0 V
75
MHz
9
fMAX
1Q
7/
4/
TC = +25C
Fig. 5
87
"
OUT
5.0 V
IN (D)
E
5.0 V
"
75
MHz
2Q
fMAX
7/
4/
Fig. 4
88
IN (A)
GND
IN (B)
OUT
"
"
2.0
8.0
ns
CLR 1 to
tPLH1
Q1
"
89
IN (B)
GND
IN (A)
OUT
"
"
"
"
"
PRE 1 to
Q1
"
90
"
OUT
IN (B)
GND
IN (A)
"
CLR 2 to
"
"
"
Q2
"
91
"
OUT
IN (A)
GND
IN (B)
"
PRE 2 to
"
"
"
Q2
Fig. 5
92
"
OUT
5.0 V
IN (D)
IN (F)
F
"
CLK 2 to
"
13.0
"
tPLH2
Q2
8/
93
"
OUT
F
IN (D)
IN (E)
5.0 V
"
CLK 2 to
"
"
"
Q2
"
94
F
IN (F)
IN (D)
5.0 V
OUT
"
"
CLK 1 to
"
"
"
Q1
"
95
5.0 V
IN (E)
"
F
OUT
"
"
CLK 1 to
"
"
"
Q1
"
96
5.0 V
IN (E)
"
F
OUT
"
"
CLK 1 to
"
11.5
"
tPHL2
Q1
"
97
F
IN (F)
"
5.0 V
OUT
"
"
CLK 1 to
"
"
"
Q1
"
98
"
OUT
F
IN (D)
IN (E)
5.0 V
"
CLK 2 to
"
"
"
Q2
"
99
"
OUT
5.0 V
IN (D)
IN (F)
F
"
CLK 2 to
"
"
"
Q2
Fig. 4
100
"
OUT
IN (B)
2.7 V
IN (A)
"
CLR 2 to
"
16.0
"
tPHL3
Q2
Fig. 4
101
"
OUT
IN (A)
2.7 V
IN (B)
"
PRE 2 to
"
16.0
"
Q2
See footnotes at end of device type 01.
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