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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X, 2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLR 1
D1
CLK 1
PRE 1
Q1
GND
Q2
PRE 2
CLK 2
D2
CLR 2
Q1
Q2
VCC
Fig. 4
102
GND
OUT
IN (A)
GND
IN (B)
5.0 V
PRE 2 to
2.0
10.0
ns
9
tPHL4
TC = +25C
Q2
"
103
"
OUT
IN (B)
GND
IN (A)
"
CLR 2 to
"
10.0
"
Q2
"
104
IN (B)
2.7 V
IN (A)
OUT
"
"
"
16.0
"
tPHL3
PRE 1 to
Q1
"
105
IN (A)
2.7 V
IN (B)
OUT
"
"
"
16.0
"
CLR 1 to
Q1
"
106
IN (A)
GND
IN (B)
OUT
"
"
CLR 1 to
"
10.0
"
tPHL4
Q1
"
107
IN (B)
GND
IN (A)
OUT
"
"
PRE 1 to
"
10.0
"
Q1
Fig. 5
108
"
OUT
5.0 V
IN (D)
IN (F)
F
"
Q2
8/
tSETUP
(H)
"
109
F
IN (F)
IN (D)
5.0 V
OUT
"
"
Q1
"
"
"
110
F
IN (F)
IN (D)
5.0 V
OUT
"
"
Q1
"
111
"
OUT
5.0 V
IN (D)
IN (F)
F
"
"
Q2
"
112
"
OUT
F
IN (D)
IN (E)
5.0 V
"
"
tSETUP
Q2
"
(L)
"
113
5.0 V
IN (E)
IN (D)
F
OUT
"
"
Q1
"
114
5.0 V
IN (E)
IN (D)
F
OUT
"
"
Q1
"
"
115
"
OUT
F
IN (D)
IN (E)
5.0 V
"
Q2
"
"
116
"
OUT
5.0 V
IN (D)
IN (F)
F
"
Q2
"
t(HOLD)
(H)
"
117
F
IN (F)
IN (D)
5.0 V
OUT
"
"
Q1
"
"
"
118
F
IN (F)
IN (D)
5.0 V
OUT
"
"
Q1
"
119
"
OUT
5.0 V
IN (D)
IN (F)
F
"
"
Q2
"
120
"
OUT
F
IN (D)
IN (E)
5.0 V
"
"
t(HOLD)
Q2
"
(L)
"
121
5.0 V
IN (E)
IN (D)
F
OUT
"
"
Q1
"
122
5.0 V
IN (E)
IN (D)
F
OUT
"
"
Q1
"
"
123
"
OUT
F
IN (D)
IN (E)
5.0 V
"
Q2
"
See footnotes at end of device type 01.
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