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TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Case X,2
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Subgroup Symbol STD-883  E,F
Measured
Unit
method Test no. CLK 1
Min
Max
terminal
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK 2 CLR 2 CLR 1
Q1
Q2
VCC
3009
33
5.5 V
5.5 V
5.5 V
0.5 V
GND
5.5 V
5.5 V
PRE 1
-0.8
-6.0
mA
1
IIL3
"
34
"
0.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
PRE 2
-0.8
-6.0
"
TC = +25C
IIL3
"
35
0.5 V
5.5 V
5.5 V
5.5 V
"
D
"
CLK 1
-2 3/
-4
"
IIL4
"
36
"
5.5 V
5.5 V
5.5 V
0.5 V
D
"
CLK 2
-2 3/
-4
"
IIL4
3010
37
GND
2.7 V
5.5 V
GND
"
5.5 V
"
K1
50
A
IIH1
"
38
"
GND
5.5 V
2.7 V
GND
5.5 V
"
K2
"
"
"
39
GND
5.5 V
2.7 V
5.5 V
"
GND
"
J1
"
"
"
40
"
5.5 V
2.7 V
5.5 V
GND
GND
"
J2
"
"
"
41
GND
5.5 V
5.5 V
GND
"
5.5 V
"
K1
1
mA
IIH5
"
42
"
GND
5.5 V
5.5 V
GND
5.5 V
"
K2
"
"
"
43
GND
5.5 V
5.5 V
5.5 V
"
GND
"
J1
"
"
"
44
"
5.5 V
5.5 V
5.5 V
GND
GND
"
J2
"
"
"
45
GND
5.5 V
GND
D
2.7 V
"
100
A
"
CLR 1
IIH2
"
46
"
D
GND
5.5 V
GND
2.7 V
"
100
A
IIH2
CLR 2
"
47
GND
5.5 V
GND
D
"
5.5 V
"
1
mA
CLR 1
IIH5
"
48
"
D
GND
5.5 V
GND
5.5 V
"
1
mA
IIH5
CLR 2
"
49
GND
GND
5.5 V
2.7 V
"
D
"
100
A
PRE 1
IIH3
"
50
"
2.7 V
5.5 V
GND
GND
D
"
100
A
IIH3
PRE 2
"
51
GND
GND
5.5 V
5.5 V
"
D
"
1
mA
PRE 1
IIH5
"
52
"
5.5 V
5.5 V
GND
GND
D
"
1
mA
IIH5
PRE 2
"
53
2.7 V
GND
GND
GND
"
GND
"
CLK 1
100
A
IIH4
"
54
"
GND
GND
GND
2.7 V
GND
"
CLK 2
100
A
IIH4
"
55
5.5 V
GND
GND
GND
"
GND
"
CLK 1
1
mA
IIH5
"
56
"
GND
GND
GND
5.5 V
GND
"
CLK 2
1
"
IIH5
3011
57
5.5 V
5.5 V
5.5 V
GND
GND
"
5.5 V
"
Q1
-40
100
"
IOS
"
58
"
GND
GND
5.5 V
5.5 V
5.5 V
5.5 V
"
Q2
"
4/
"
"
"
"
"
59
5.5 V
5.5 V
5.5 V
5.5 V
GND
"
GND
"
Q1
"
"
"
"
60
GND
"
5.5 V
5.5 V
5.5 V
5.5 V
GND
"
Q2
3005
61
5.5 V
5.5 V
5.5 V
GND
"
GND
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
50
"
ICC
VCC
3005
62
5.5 V
5.5 V
5.5 V
5.5 V
"
5.5 V
5.5 V
5.5 V
5.5 V
GND
GND
"
50
"
ICC
VCC
See footnotes at end of device type 02.

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