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| TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Case X,2
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Subgroup Symbol STD-883 E, F
Measured
Unit
method Test no. CLK 1
Min
Max
terminal
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK 2 CLR 2 CLR 1
Q1
Q2
VCC
1
3006
1
C 2/
0.8 V
2.0 V
2.0 V
-1 mA
2.0 V
4.5 V
2.5
V
GND
Q1
VOH
TC =25C
"
2
"
-1 mA
2.0 V
2.0 V
0.8 V
C
2.0 V
"
"
"
Q2
"
"
"
3
C
2.0 V
0.8 V
2.0 V
-1 mA
"
2.0 V
"
Q1
"
"
"
4
-1 mA
"
2.0 V
0.8 V
2.0 V
C
2.0 V
"
Q2
"
5
5.5 V
5.5 V
5.5 V
0.8 V
-1 mA
"
2.0 V
"
"
"
Q1
"
6
"
-1 mA
0.8 V
5.5 V
5.5 V
5.5 V
2.0 V
"
"
"
Q2
"
"
"
7
5.5 V
5.5 V
5.5 V
2.0 V
-1 mA
"
0.8 V
"
Q1
"
"
"
8
-1 mA
"
2.0 V
5.5 V
5.5 V
5.5 V
0.8 V
"
Q2
3007
9
C
0.8 V
2.0 V
2.0 V
20 mA
"
2.0 V
"
0.5
"
Q1
VOL
"
"
"
10
20 mA
"
2.0 V
2.0 V
0.8 V
C
2.0 V
"
Q2
"
11
C
2.0 V
0.8 V
2.0 V
20 mA
"
2.0 V
"
"
"
Q1
"
12
"
20 mA
2.0 V
0.8 V
2.0 V
C
2.0 V
"
"
"
Q2
"
"
"
13
5.5 V
5.5 V
5.5 V
0.8 V
20 mA
"
2.0 V
"
Q1
"
"
"
14
20 mA
"
0.8 V
5.5 V
5.5 V
5.5 V
2.0 V
"
Q2
"
15
5.5 V
5.5 V
5.5 V
2.0 V
20 mA
"
0.8 V
"
"
"
Q1
"
16
"
20 mA
2.0 V
5.5 V
5.5 V
5.5 V
0.8 V
"
"
"
Q2
17
-18 mA
"
"
CLK 1
-1.2
"
VIC
18
-18 mA
"
"
K1
"
"
19
-18 mA
"
"
J1
"
"
20
-18 mA
"
"
PRE 1
"
"
21
"
-18 mA
"
PRE 2
"
"
22
"
-18 mA
"
J2
"
"
23
"
-18 mA
"
K2
"
"
24
"
-18 mA
"
CLK 2
"
"
25
"
-18 mA
"
CLR 2
"
"
26
"
-18 mA
"
CLR 1
"
"
3009
27
5.5 V
0.5 V
5.5 V
D
"
5.5 V
5.5 V
K1
-0.7
-1.6
mA
IIL1
"
28
"
D
5.5 V
0.5 V
5.5 V
5.5 V
"
K2
"
"
"
"
29
5.5 V
5.5 V
0.5 V
5.5 V
"
D
"
J1
"
"
"
"
30
"
5.5 V
0.5 V
5.5 V
5.5 V
D
"
J2
"
"
"
"
31
5.5 V
5.5 V
5.5 V
5.5 V
"
0.5 V
"
CLR 1
-0.8
-7.0
"
IIL2
"
32
"
5.5 V
5.5 V
5.5 V
5.5 V
0.5 V
"
CLR 2
-0.8
-7.0
"
IIL2
See footnotes at end of device type 02.
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