 |
|||
|
Page Title:
Table 3. Group A inspection for device type 04-cont. |
|
||
| ||||||||||
|
|  TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLR
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK
Q1
Q2
VCC
Fig. 9
122
E
GND
IN (E)
2.7 V
OUT
GND
IN (A)
5.0 V
7/
9
Q1
tSETUP
(H)
"
123
E
"
OUT
2.7 V
IN (E)
GND
"
"
Q2
"
TC = +25C
"
"
124
2.7 V
IN (E)
GND
E
OUT
"
"
"
Q1
"
"
125
"
"
OUT
E
GND
IN (E)
"
"
Q2
"
126
"
GND
IN (F)
E
OUT
"
"
"
"
Q1
tHOLD
(L)
"
127
"
"
OUT
E
IN (F)
GND
"
"
Q2
"
"
"
128
E
IN (F)
GND
2.7 V
OUT
"
"
"
Q1
"
"
129
"
"
OUT
2.7 V
GND
IN (F)
"
"
Q2
"
130
"
GND
IN (G)
2.7 V
OUT
"
"
"
"
Q1
tHOLD
"
(H)
"
131
"
"
OUT
2.7 V
IN (G)
GND
"
"
Q2
"
132
2.7 V
IN (G)
GND
E
OUT
"
"
"
"
Q1
"
133
2.7 V
"
OUT
E
GND
IN (G)
"
"
Q2
"
Fig. 7
134-137
60
MHz
10
fMAX
6/
TC = +125C
Fig. 6
138-141
2.0
11.0
ns
tPLH1
Same tests and terminal conditions as for subgroup 9, except TC = +125C and limits are as shown.
Fig. 7
142-145
"
"
"
tPLH2
Fig. 6
146-149
"
"
"
tPHL3
See footnotes at end of device type 04.
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals