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Page Title:
Table 3. Group A inspection for device type 04-cont. |
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|  TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLR
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK
Q1
Q2
VCC
10
Fig. 7
150-153
2.0
11.0
ns
tPHL2
TC = +125C
Fig. 8
154-157
7/
tSET
(L)
"
158-161
"
tSET
Same tests and terminal conditions as for subgroup 9, except TC = +125C and limits are as shown.
(H)
"
162-165
"
tHOLD
(L)
"
166-169
"
tHOLD
(H)
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ C = Normal clock pulse.
D = Momentary connection: 5.0 V to momentary GND to 5.0 V occurs before measurement is made (for
subgroups 9, 10, and 11, D occurs prior to other input pulses).
E = Normal input conditioning is 5.0 V, however, momentary logic "0" may be applied to the input
for synchronizing test equipment and for preconditioning the device.
2/ For circuit B, IOS(max) is 110 mA.
3/ Only a summary of attributes data is required.
4/ Inputs: A = 2.4 V minimum, B = 0.4 V.
5/ Outputs: H ≥ 1.5 V, L ≤ 1.5 V.
6/ fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
7/ Monitor output to verify functionally with t(SETUP) and t(HOLD) conditions as shown on figure 8.
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