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Page Title:
Table 3. Group A inspection for device type 05-cont. |
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|  TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X,
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
2 1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Subgroup Symbol STD-883 E, F
Measured
Unit
method Test no. CLR
Min
Max
terminal
Q1
D1
D2
Q2
D3
Q3
GND
CLK
Q4
D4
Q5
D5
D6
Q6
VCC
7 4/ 5/
65
A
H
B
B
H
B
H
GND
B
H
B
H
B
B
H
4.5 V
All
H or L 6/
V
66
"
L
B
B
L
B
L
"
A
L
B
L
B
B
L
"
outputs
as shown
"
TC = +25C
67
"
L
A
A
L
A
L
"
B
L
A
L
A
A
L
"
"
"
"
68
"
H
"
"
H
"
H
"
A
H
"
H
"
"
H
"
"
"
"
69
"
H
"
"
H
"
H
"
B
H
"
H
"
"
H
"
"
"
"
70
B
L
"
"
L
"
L
"
B
L
"
L
"
"
L
"
"
"
"
8 4/ 5/
Same tests, terminal conditions and limits as for subgroup 7, except TC = +125C and -55C.
Fig. 14
71
2.7 V
OUT
IN (B)
GND
IN (A)
5.0 V
75
MHz
9
Q1
fMAX
7/
"
72
"
IN (B)
OUT
"
"
"
"
"
TC = +25C
Q2
"
73
"
IN (B)
OUT
"
"
"
Q3
"
"
"
74
"
"
"
OUT
IN (B)
"
Q4
"
"
"
75
"
"
"
OUT
IN (B)
"
"
"
Q5
"
76
"
"
"
IN (B)
OUT
"
"
"
Q6
Fig. 15
77
"
OUT
IN (E)
"
IN (C)
"
CLK to Q1
2.0
14.0
ns
tPLH1
"
78
"
IN (E)
OUT
"
"
"
CLK to Q2
"
"
"
"
79
"
IN (E)
OUT
"
"
"
CLK to Q3
"
"
"
"
80
"
"
"
OUT
IN (E)
"
CLK to Q4
"
"
"
"
81
"
"
"
OUT
IN (E)
"
CLK to Q5
"
"
"
"
82
"
"
"
IN (E)
OUT
"
CLK to Q6
"
"
"
Fig. 13
83
IN (F)
OUT
2.7 V
"
IN (G)
"
CLK to Q1
"
"
"
tPLH2
"
84
"
2.7 V
OUT
"
"
"
CLK to Q2
"
"
"
"
85
"
2.7 V
OUT
"
"
"
CLK to Q3
"
"
"
"
86
"
"
"
OUT
2.7 V
"
CLK to Q4
"
"
"
"
87
"
"
"
OUT
2.7 V
"
CLK to Q5
"
"
"
"
88
"
"
"
2.7 V
OUT
"
CLK to Q6
"
"
"
See footnotes at end of device type 05.
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