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|  MIL-M-63320A(AR)
Test methods, c i r c u i t s and p r o c e d u r e s .
4.5
4.5.1 A l t e r n a t e methods, circuits
and p r o c e d u r e s . Unless
o t h e r w i s e stated in the specific test method, the methods and
c i r c u i t s shown are given as basic measurement method. F o r alternate
m e t h o d s , circuits and procedure the manufacturer shall demonstrate
t o the procuring activity that alternates which he may desire and
propose t o use are equivalent and give results within the desired
accuracy of measurement (see 6.3).
4 . 5 . 2 D e f e c t i v e . Any device f a i l i n g to meet the applicable
requirements in the following t e s t s shall be classed and labeled
d e f e c t i v e and segregated from the inspection lot.
4 . 5 . 3 T e s t c o n d i t i o n s . U n l e s s otherwise specified all
e x a m i n a t i o n s and tests shall be made under the following conditions.
Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25C
Humidity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 to 60 percent RH
Pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 2 inches Hg
Voltage&Currents . . . . . . . . . . . . . . . . . . . . . . 2%
0
Temperature (ALL) Tolerance . . . . . . . . . . . . . 5 C
4 . 5 . 4 I n p u t current. Connect pins 10, 11, 13 and
15 to VD D
2, 10, 11 and
a n d measure the current into each pin, connect pins 1,
pin. Any
13 to VSS (ground) and measure t h e current out of each
d e v i c e failing to meet the max current requirement of
3.5.2.1 shall
b e classed defective. ( N o n - d e s t r u c t i v e test).
4 . 5 . 5 L e a k a g e current oscillator. Measure the leakage current
with the device connected as shown in Figure 1. A n y device failing
t o meet the max current requirement of 3.5.2.2 shall be classed
defective.
( N o n - d e s t r u c t i v e test).
4 , 5 , 6 Leakage current low. M e a s u r e the leakage current in
accordance with the test sequence of Table IV and with the device
connected as shown in Figure 2. Any device failing to meet the max
c u r r e n t requirement of 3.5.2.3 shall be classed defective.
( N o n - d e s t r u c t i v e test).
4 . 5 . 7 I n p u t c u r r e n t . Measure the current into pin 1 with pin 1
held at VD D. Any device failing to meet the max and pin current
r e q u i r e m e n t of 3,5.2.4 shall be classed defective. ( N o n destructive
test).
4 . 5 . 8 I n p u t c u r r e n t . Measure the current out of pin 15 with pin
15 held at VSS ( g r o u n d ) . Any device failing to meet the max and
m i n current requirement of 3.5.2.5 shall be classed defective. ( Non-
destructive test).
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