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|  MIL-M-63324A(AR)
3.5.3 Screening. All devices to be delivered in accordance
with this specification shall be subjected to the screening tests of
Table II in accordance with the applicable procedures for Class B
devices per MIL-STD-883, Method 5004. Interim and final electrical
test parameters are specified in TABLE I herein.
3.5.4 Steady state life. The devices shall be subjected to the
steady state life test of MIL-STD-883} Method 1005, Condition D and
4.5.2 herein. Intermediate measurements of device characteristics,
sufficient to reveal both catastrophic and degradation failures,
shall be made at 360 (+120, -0) hours.
3.5.5 Static discharge (Vzap test). Devices subjected to the
static discharge test shall be connected as shown in FIGURE 2. Each
input terminal which has static discharge input circuit protection
shall be tested; however, only one input terminal per device shall
be tested.
3.6 Device marking. Marking of the device shall be in
accordance with this specification and MIL-M-38510 as applicable.
The marking shall be legible and complete, and shall meet the
resistance to solvents requirements of MIL-STD-883, Method 2015.
The following markings shall be placed on each device:
a.
Index point (Pin No 1) see DWG 9292968
b.
Part No.:
Example:
DWG revision letter)
9292968X (X:
c. Inspection lot identification (Date Code)
d.
Manufacturer's identification
Markings a, b and c shall be placed on the top surface of the
device. Marking d may be placed in any suitable location without
interfering with the other markings.
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