 |
|||
|
|
|||
| ||||||||||
|
|  MIL-M-63324A(AR)
4.4.3 Testing. Testing is described in the First Article and
Quality Conformance Inspection Tables.
4.4.4 Inspection equipment. The inspection equipment required
to perform the examination and tests prescribed herein is described
in the Paragraph Reference/Inspection Method column in Tables III
and IV. The contractor shall submit for approval inspection
equipment designs in accordance with the terms of the contract
(see 6.4).
4.5 Test methods, circuits and procedures. The contractor
shall submit to the qualifying agency (6.5) for approval the test
circuits and procedures to be used to measure the electrical
characteristics of the device as specified in TABLE I. The
information submitted shall identify the loading conditions on all
device pins, the dynamic drive signal characteristics (type,
magnitude, frequency, rise time, duration, fall time) applied to the
device during each test, and the type of equipment used to make the
measurement and how it is connected to the device under test.
4.5.1 Screening. Screening of devices shall be conducted as
specified in Table II, in the sequence shown, using only Government
approved test equipment. Devices which fail any of the acceptance
test criteria during the screening procedure shall be removed from
the lot at the time of observation or immediately at the conclusion
of the test in which the failure was observed. Testing is
non-destructive and only devices that pass all of the screening
tests of Table II shall be returned to the lot. (Non-destructive).
4.5.2 Steady state life. Devices shall be subjected to the
steady state life test in accordance with MIL-STD-883, Method 1005,
Condition D, and as specified herein. Test duration shall be 1000
hours minimum at
+
For this test the device shall be
connected as shown in Figure 1; the same test set up as for the
burn-in test. Electrical parameters shall be measured before,
during (see 3.5.4) and after the steady state life test in
accordance with Method 1005. Observation shall be made for
compliance with requirements of Table I and 3.5.4.
(Non-destructive).
4.5.3 Static discharge (Vzap test). Unless otherwise
specified, one input terminal of the device under test (DUT) shall
be subjected to a voltage pulse from a high voltage source. This
destructive test shall be conducted as follows using the test
circuit on Figure 2.
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals