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Page Title:
Microcircuit, Digital, CMOS, Special Purpose Nor Gate |
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|  MIL-M-63324A(AR)
AMENDMENT 1
13 MAY 1982
MILITARY
SPECIFICATION
MICROCIRCUIT,
DIGITAL,
CMOS,
SPECIAL PURPOSE NOR GATE
This amendment forms a part of Military Specification
MIL-E-63324A(AR), dtd 8 April 1981, and is approved
for use by the US Army Armament Research and Develop-
ment command, and is available for use by all Depart-
ments and Agencies of the Department of Defense.
PAGE 13
4.5.2
Steady state life, line 3:
Change "Test duration shall
be
0
1000 hours minimum at 125 C + 5 C" to "Test duration
shall be 1000 hours minimum at
C+
or equivalent as
per option given in 3.2.1 Test temperature - Standard life
Method 1005 of MIL-STD-883B.
Temperature in excess of 135
shall not be allowed.".
PAGE 16
6.4, line 7:
Delete
"DRDAR-QAA-I"
and
substitute
"DRDAR-QAT-I".
6.5, line 4: Delete "DRDAR-QAA-M"
and
substitute
"DRDAR-QAT-M".
Custodians:
Preparing
activity:
Army-AR
Army-AR
(Project
1345-A222)
FSC
1345
1 of 1
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