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|  MIL-M-63530 (AR)
4.5.11 Output low. Measure the current into pin 10 with pin 9 connected
and pin 10 held at 0.1 volts. Measure the current into pin 11 with
to
and pin 11 held at 0.1 volts. Any device failing to
pin 9 connected to
(Non-destructive
meet the requirements of 3.5.2.8 shall be classed defective.
test).
4.5.12 Output high. Force each pin 2 and 3 to
through 5K ohms,
-
then measure the current out of pin 3 with pin 3 held at a voltage of
0.1 volts. by device failing to meet the requirements of 3.5.2.9 shall be
(Non-destructive test).
classed defective.
4.5.13 Output high. Select appropriate points in the functional test to
pause and measure the output current drive of pin 5 and then pin 6. Measure
the current out of each pin each held at 2.0 volts. Any device failing to
meet the requirements of 3.5.2.10 shall be classed defective.
(Non-destructive test).
4.5.14 Output high. Measure the current out of pin 10 with pin 9
- 0.1 volts. Measure the current
connected to
and pin 10 held at
out of pin 11 with pin 9 connected to
and pin 11 held at
- 0.1
volts. Any device failing to meet the requirements of 3.5.2.11 shall be
classed defective.
(Non-destructive test).
4.5.15 Switching point.
Set pin 9 at 2.5 volts and check to see that pin
10 output is less than 1.5 volts. Set pin 9 at the specified maximum voltage
and check to see that pin 10 output voltage is greater than
- 1.5
volts. Drive pins 2 and 3 through SK ohm resistors to
and then set the
pin 3 drive input at the specified maximum voltage. The pin 3 P channel
transistor should be "on" and the actual pin 3 voltage will differ from the
drive input by at least 1.0 volts. Set the pin 2 drive input at the specified
minimum voltage and verify that the pin 3 P channel is still "on" (that is no
change at pin 3). Set the pin 2 drive input at the specified maximum voltage
and verify that the pin 3 P channel is "off". The N channel transistor on pin
2 should be "on". Drop the pin 2 drive input to the specified minimum voltage
and the actual pin 2 voltage should differ from the drive input by at least
1.0 volts. Set-the pin 3 drive input at the specified minimum voltage and
verify that the pin 2 N channel is now "off". Any device failing to meet the
requirements of 3.5.2.12 shall be classed defective.
(Non-destructive test).
4.5.16 Switching point. This test is run in conjunction with functional
test sequence #3 Pause at the point where pin 4 is to be switched from a "l"
to a "O". Set pin 4 at the specified maximum voltage and verify that pin 6
has not switched. Reduce pin 4 to the specified minimum and determine the
voltage that pin 6 switches. Any device failing to meet the requirements of
3.5.2.13 shall be classed derective.
(Non-destructive test).
19
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