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|  MIL-O-81144B(OS)
4.5.3.3 Low temperature, nonoperating. The oscillator subassembly shall
be subjected to the "Low temperature, nonoperating" test of MIL-E-82590
and thereafter shall meet the requirements of 3.5.3.3.
4.5.3.4 Low temperature operating. The oscill ator subassembly shall be
subjected to the Low temperature; operating" test of MIL-E-82590 and,
while at the test temperatureshall meet the requirements of 3.5.3.4
4.5.5.1 connect the oscillator subassembly as shown
in Figure 1. Apply
filament power to the vacuum tbe and allow it to warm
up for at least
30 seconds. Apply 150 plus or minus 1 vdc as shown in
Figure 1, and allow
the circuit to operate for 30 plus or minus 1 minutes.
Then remove the
150 vdc and allow the circuit to rest for at least one
hour . This shall
be considered one cycle of operation.
4.5.5.2 Repeat 4.5.5.1 until 800 cycles of operation have been com-
pleted, after which the oscillator subassembly shall meet the require-
ments of 3.4.1 through 3.4.4.
4.5.5.3 The vacuum tube and test circuit components maybe replaced
as necessary to permit the continance of this test.
4.6 Waiver of tests. Tests 'specified in 4.5.1.4 and 4.5.2 above may
be waived by the procuring agency for Level C packs only, provided the
contractor guarantees safe delivery to the using activity.
4.7 Fundcional tests. At the conclusion o f the tests specified in
4.5.1.4 and 4.5.2 above, functional and other tests, as applicable, shall
be conducted on the oscillator subassembly to determine freedom from
operational malfunction and compliance with all performance requirement
and product characteristics of this specification.
PREPARATION
DELIVERY
5.
5.1 Preservation and packaging. The levels of preservation and pack-
aging shall be as specified (see 6.2).
5.1.1 Level A
5.1.1.1 Unit packaging. The oscillator shall be packaged in accord-
ance with Method IIB of MIl-P-116.
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