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|  MlL-T-48134A (MU)
4.3.1) of the components or assemblies designated in the appli-
cable paragraph headings.
Inspection for Critical Defects (and
Major Defects, when so specified) shall be 100 percent. Sampling
plans for Major and Minor Defects shall be in accordance with MIL-
STD-105 except that continuous sampling plans in accordance with
MIL-STD-1235 may be used if approved by the Government.
Ins tead
of applying the AQL's designated herein to the groups of Major
and Minor Defects listed, the contractor may elect to apply AQL's
to individual defects using an AQL of 0.40 percent for each Major
Defect and an AQL of 0.65 percent for each Minor Defect. When
this method is elected, it shall be applied to all of the Major
and Minor Defects listed in the applicable sub-paragraphs of this
section, except where 100 percent inspection is specified, and be
documented as part of the contractor's inspection system. Equip-
ment necessary for the performance of the inspections listed shall
be in accordance with 4.3.4.
4.3.2.1 Housing (see dWg. 8800936 covering a detail of
dwg. 9227694).
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