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| MIL-M-38510/125B
TABLE I. Electrical performance characteristics Continued.
Conditions
Device
Limits
Unit
Test
Symbol
-55C ≤ TA ≤ +125C
type
VCC = 15 V,
see figure 3 and 3.5
Min
Max
unless otherwise specified
Output short circuit current
01
-25
mA
VIN = 10 V, t ≤ 25 ms,
IOS(+)
(positive output)
short circuit to 0 V
02
-30
01
25
mA
Output short circuit current
VIN = -10 V, t ≤ 25 ms,
IOS(-)
(negative output)
short circuit to 0 V
02
30
Hold mode leakage current
01,02
-100
100
pA
VIN = 0 V, +VCC = 3.5 V, TA = +25C,
IHL(+) 6/
(positive output)
-VCC = -26.5 V, see figure 8
-50
50
nA
VIN = 0 V, +VCC = 3.5 V, TA = +125C,
-VCC = -26.5 V, see figure 8
01,02
-100
100
pA
Hold mode leakage current
VIN = 0 V, +VCC = 26.5 V, TA = +25C,
IHL(-)
(negative output)
6/
-VCC = -3.5 V, see figure 8
-50
50
nA
VIN = 0 V, +VCC = 26.5 V, TA = +125C,
-VCC = -3.5 V, see figure 8
Hold capacitor charge
01,02
-3
mA
VIN = 11.5 V, VHC = 9.5 V, TA = +25C
ICH(+)
current (positive output)
-2
VIN = 11.5 V, VHC = 9.5 V,
-55C ≤ TA ≤ +125C
Hold capacitor charge
01,02
3
mA
VIN = -11.5 V, VHC = -9.5 V, TA = +25C
ICH(-)
current (negative output)
2
VIN = 11.5 V, VHC = 9.5 V,
-55C ≤ TA ≤ +125C
Differential logic threshold
01,02
2
V
VTH(H)
VIN = -2 V, VLOGIC = 2 V
(check for IHOLD CAP ≥ 1 mA)
0.8
VTH(L)
VIN = -2 V, VLOGIC = 0.8 V
(check for IHOLD CAP ≤ 10 A)
01,02
25
Acquisition time
s
taq 7/
VIN = 0 V to 10 V,
(0.1 % error)
10 V to 0 V, 0 V to 10 V,
-10 V to 0 V, CL = 100 pF,
TA = +25C, see figures 9 to 11
01,02
300
ns
Aperture time
tap 8/
VIN = 0 V to +10 V,
10 V to 0 V, 0 V to 10 V,
-10 V to 0 V, VO ≤ 1 mV,
TA = +25C, see figures 12 to 15
See footnotes at end of table.
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