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Recommended operating conditions. |
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|  MIL-M-38510/245B
1.3 Absolute maximum ratings.
Device types 01, 02, 03, 04
Device types 05, 06
Supply voltage range (VDD VSS)
-0.3 to +7.0 V
-0.5 V to +7.0 V
VSS -0.3 V to VDD +0.3 V
VSS -0.5 V to VDD +0.5 V
Input viltage range
Input current, any one point
10 mA
-65 C to +150C
-65 C to +150C
Storage temperature range
Maximum power dissipation
200 mW
500 mW
MPD per output transistor
100 mW
300C
300C
Lead temperature (soldering)
10 seconds maximum
0.04C/mW
Thermal resistance
junction to case
175C
175C
Junction temperature
Radiation level
As indicated by RHA level designator
1.4 Recommended operating conditions.
Device types 01, 02, 04
Device types 03
Device types 05, 06
Supply voltage (VDD VSS)
4.5 V to 5.5 V
4.5 V to 5.5 V
4.75 V to 5.25 V
Input low (VIL) voltage range
VSS -0.3 V to VSS +0.8 V
VSS -0.3 V to VSS+0.8 V VSS+0.8 V maximum
Input high (VIH) voltage range
VDD -2.0 V to VDD
CE , W : VDD-1.5 V
VDD/2 minimum
to VDD
Others: VDD -2.0 V
to VDD
-55C to -125C
-55C to +125C
-55C to +125C
Cae operating temperature range
Timing parameters
(See figure 4)
(See figure 4)
(See figure 4)
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section
does not include documents cited in other sections of this specification or recommended for additional information or as
examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they
must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are
listed.
2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the
extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or
contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard for Microelectronics.
MIL-STD-1835
-
Interface Standard Electronic Component Case Outlines
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein,
(except for associated detail specifications, specification sheets, or MS standards), the text of this specification takes
precedence. Nothing in this specification, however, shall supersede applicable laws and regulations unless a specific
exemption has been obtained.
2
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