 |
|||
|
Page Title:
Total dose irradiation testing. |
|
||
| ||||||||||
|
|  MIL-M-38510/245B
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.4.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation
hardness assured. RHA levels for device classes B and S shall be M, D, R, and H.
a.
End-point electrical parameters shall be as specified in table II herein.
b.
For device classes B and S subgroups 1 and 2 of table V method 5005 of MIL-STD-883, shall be tested
as appropriate for device construction.
4.4.5.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-
STD-833 method 1019 and as specified herein.
a.
Device shall be biased in accordance with table VII herein and meet the postirradiation end-point electrical
parameters as defined in table VI herein as +25C after exposure.
b.
Bias may be interrupted for up to 1 minute to remove devices to remote bias fixture. The start and
completion of the end-point electrical parameter measurements shall not exceed 1 hour following
irradiation.
4.4.5.1.1 Accelerated aging test. Accelerated aging shall be performed on all devices requiring a RHA level
greater than 5K rads (Si). The post-anneal end-point electrical parameter limits shall be as specified in
table III herein and shall be the preirradiation end-point electrical parameter limit at +25C 5C. Testing
shall be performed at initial qualification and after any design or process changes which may effect the
RHA response of the device.
4.4.5.2 Additional information. When specified in the purchase order or contract, a copy of the following additional
data shall be supplied.
a.
RHA upset levels.
b.
RHA delete limits.
4.4.6 Inspection of packaging. The inspection of package shall be as specified in.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
NOTE: In order to prevent "latch-up" during device turn-on and also prevent a high initial operating current (IDDOP),
set all devices terminals equal to VSS. Raise VDD and CE simultaneously to normal system operating
VDD. Do not allow VIH at CE to exceed VDD +0.3 volts while rising. Not necessary for SOS products.
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit VSS terminal. Currents given are
conventional and positive when flowing into the referenced terminal.
4.5.2 Life test, burn-in, cooldown, and electrical test procedure. When devices are measured at +25C following
application of the steady-state life or burn-in test condition, all devices shall be cooled to +35C prior to removal of
bias voltages. Any electrical tests required shall first be performed at -55C or +25C prior to any +125C tests that
are required.
4.5.3 Delta measurements. Delta measurements, as specified in table II, shall be made and recorded before and
after the required burn-in screens and steady state life tests to determine delta compliance. The electrical
parameters to be measured, with associated delta limits are listed in table IV.
69
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals