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|  MIL-M-63321A(AR)
4.5.14 Oscillator function test. The device shall be connected as
shown in Figure 10 and tested for the requirements specified in paragraph
3.5.4. Any device failing to meet the applicable requirement shall be
classed defective. This is a non-destructive test.
4.5.15 Dual pins/bond pads. The resistance specified in 3.5.5 shall
be measured using a Government approved ohmmeter. During this test, 5.0
.10 volts shall be applied between pin 8 (ground) and pin 16
and the drive current from the ohmmeter shall be 100 microampere
maximum. Any device failing to meet the applicable requirement shall be
classed defective. This is a non-destructive test.
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