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| MIL-P-63334(AR)
4.3.2 Examination and tests.
4.3.2.1 Components and subassemblies. All components and subassemblies
shall be inspected in accordance with the inspection provisions contained in
Supplementary Quality Assurance Provisions (SQAP) listed in the technical data
package (TDP). In the absence of SQAPs, the applicable Quality Assurance
Provisions of MIL-F-13926 shall apply. Examination, and tests related to
Section 3 herein shall be performed on a single defect (individual charac-
teristic) basis in accordance with MIL-STD-105 and the sampling plans speci-
fied in Tables V, VI, and VII herein. Examination and tests for packaging,
packing, and marking shall be in accordance with MIL-P-14232 and Section 5
herein. The tabulated classification of defects in Tables V, VI, and VII
shall constitute the minimum inspection to be performed by the supplier after
first article approval and prior to Government acceptance or rejection by item
or lot.
TABLE V - CLASSIFICATION OF DEFECTS
TEST PROCEDURE
REQUIREMENT
4.6.4
3.4.1
101.
Vibration
102.
Input immunity to reverse
4.6.5.1
3.5.3
polarity
4.6.5.2
3.5.4
103.
Ground potential
4.6.5.3
104.
3.6.1
Rheostat performance
4.6.5.4
3.6.1.1
105.
Rheostat R1
4.6.5.5
3.6.1.2
106.
Rheostat R2
107.
Regulated output, switch S1
4.6.5.7.1
3.6.1.4
"OFF"
108.
Regulated output, 30 VDC
4.6.5.7.2
3.6.1.4
with minimum load
109.
Regulated output, 18 VDC
4.6.5.7.3
3.6.1.4
with minimum load
110.
Regulated output, 18 VDC
4.6.5.7.4
3.6.1.4
with maximum load
Regulated output, 30 VDC
111.
4.6.5.7.5
3.6.1.4
with maximum load
112.
Regulated output, 6.2 VDC
4.6.5.7.6
3.6.1.4
with maximum load
113.
Regulated output, 6.2 VDC
4.6.5.7.7
3.6.1.4
with minimum load
4.6.5.8
3.6.1.5
114.
Output voltage rise time
4.6.5.10
Battery charging circuit
3.6.2
115.
4.6.5.11
3.6.3
116.
Controls
MINOR: NONE
NOTE:
The tests in Table V shall be conducted at a temperature between
+60 and +90F.
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